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Speci?cations and Test Methods
Specification
C49E.pdf
Mar.12,2014
No. AEC-Q200 Test Item Temperature Compensating Type High Dielectric Constant Type
AEC-Q200 Test Method
Appearance
(Char. X8G)
(Char. X8L)
Visual inspection.
2
Capacitance Within the specified tolerance
Char. Nominal Cap. Frequency
Voltage
Q/D.F.
U
V
G
Insulation
Resistance
Room
Temperature
Ω
Ω ·μ
V
(I.R.)
High
Ω
Ω ·μ
Electrical
17 Charac-
Temperature
V
terization
Between
Terminals
V
The capacitor is placed in a container
Dielectric
Strength
Body
Insulation
metal balls.
V
Tensile
Strength
in the radial direction of the capacitor
18
Terminal
Strength
Bending
Strength
opposite direction at the rate of one bend per 2 to 3 seconds.
The capacitance change should be measured after 5min. at
each specified temperature step.
Step
Temperature (°C)
Capacitance
19 Temperature
Characteristics
Within the specified
Tolerance.
2
3
4
5
The temperature coefficient or the ranges of capacitance
change is determined using the capacitance measured in
step 3 as a reference.
Table A
Char.
X8G
28
Nominal Values
(ppm/°C) *
Capacitance Change from 25°C (%)
–55°C –30°C –10°C
Max. Min. Max. Min. Max. Min.
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